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走査型電子顕微鏡 (そうさがたでんしけんびきょう) Japanese meaning | Kotomora

走そう査さ型がた電でん子し顕けん微び鏡きょう

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Meanings

1

noun

scanning electron microscope; SEM

Scientific instrument that scans a sample with a focused electron beam to produce high-resolution surface images.

走そう査さ型がた電でん子し顕けん微び鏡きょうで花か粉ふんの表ひょう面めん構こう造ぞうを観かん察さつした。
We observed the surface structure of pollen with a scanning electron microscope.

SEMは走そう査さ型がた電でん子し顕けん微び鏡きょうの略りゃく称しょうです。

SEM is an abbreviation for scanning electron microscope.

Kanji

走run
査investigate
型mould, type, model
電electricity
子child, sign of the rat, 11PM-1AM
顕appear, existing
微delicate, minuteness, insignificance
鏡mirror, speculum, barrel-head

Similar words

透とう過か型がた電でん子し顕けん微び鏡きょう
Transmission electron microscope (TEM); electrons pass through a thin sample, whereas SEM scans the surface.
電でん子し顕けん微び鏡きょう
General term for electron microscope; 走査型電子顕微鏡 is a specific type.

Etymology

Compound of 走査 (scanning), 型 (type), 電子 (electron), and 顕微鏡 (microscope). A direct calque of the English 'scanning electron microscope'.